DDR5 RDIMM及支持下一代MR-DIMM單體測(cè)試驗(yàn)證系統(tǒng) (DDR5 MR-DIMM Module Test System), 支持的速率可高達(dá)17.4Gbps.

DDR5內(nèi)存測(cè)試系統(tǒng)：DDR5 RDIMM測(cè)試系統(tǒng)，DDR5內(nèi)存測(cè)試系統(tǒng)， DDR5 MR-DIMM測(cè)試系統(tǒng)，DDR5 RCD/DB芯片測(cè)試，DDR5芯片測(cè)試，DDR5接收機(jī)測(cè)試，DDR5發(fā)射機(jī)測(cè)試，DDR5數(shù)據(jù)緩沖測(cè)試，DDR5誤碼測(cè)試儀，DDR5寄存器芯片測(cè)試，DDR5 DIMM Module測(cè)試系統(tǒng)，DDR5 DRAM測(cè)試系統(tǒng)

The M5513 is an all-inclusive memory test system for next-generation DDR5 multiplexed-rank dual inline

memory modules (MR-DIMM). Operating at blisteringly fast speeds, this test system is an ideal solution for longterm

DIMM development and test. It contains a complete side-band bus controller and provides full access to all

command, address, and data pins on a standard 288-pin DIMM under test. The M5513 can characterize the DDR

interface at its maximum speed, and it can also perform exhaustive memory read-write testing and functional

stress testing. A true ATE-on-Bench, the M5513 reduces cost and enhances interoperability of DDR5 systems.

M5513是一款適用于下一代DDR5多路復(fù)用列雙列直插存儲(chǔ)器的全包式存儲(chǔ)器測(cè)試系統(tǒng)

存儲(chǔ)器模塊（MR-DIMM）。該測(cè)試系統(tǒng)以極快的速度運(yùn)行，是長(zhǎng)期運(yùn)行的理想解決方案

DIMM開(kāi)發(fā)和測(cè)試。它包含一個(gè)完整的邊帶總線控制器，并提供對(duì)所有

測(cè)試中的標(biāo)準(zhǔn)288引腳DIMM上的命令、地址和數(shù)據(jù)引腳。M5513可以表征DDR

接口的速度，它還可以執(zhí)行詳盡的內(nèi)存讀寫(xiě)測(cè)試和功能

壓力測(cè)試。M5513是一款真正的臺(tái)式ATE，它降低了成本，增強(qiáng)了DDR5系統(tǒng)的互操作性。