TestMetrix SD/eMMC協(xié)議符合性/一致性測(cè)試解決方案

SD/eMMC Compliance Tester,TestMetrix SD/eMMC協(xié)議符合性測(cè)試，TestMetrix SD/eMMC協(xié)議一致性測(cè)試，SD/eMMC Compliance Tester 

The VTE-7100 is a high performance Engineering / Compliance Tester and Protocol Analyzer that is offered in a variety of configurations. The tester can be configured with dedicated Test Adapters and associated Software Test Libraries to support the following devices:

• SD Cards & Hosts

• eMMC Chips/Cards

• UFS Cards and Hosts

• NAND Flash Memory chips

• SSD Drives

• MIPI Sensors and Displays

The VTE-7100 is offered with a user friendly MS Win10/11 compliant appli-cation program.

The VTE-7100 main screen allows the user to visualize the test script u-tions in one window, the parameters of uted functions or graphic results of the test in a second window, and the test result messages in a third win-dow.

The test system can be also configured to perform parallel testing using mul-tiple channels, including testing Tx and Rx devices simultaneously.

VTE-7100是一款高性能工程/合規(guī)測(cè)試儀和協(xié)議分析儀，提供多種配置。測(cè)試儀可以配置專用的測(cè)試適配器和相關(guān)的軟件測(cè)試庫(kù)，以支持以下設(shè)備：

•SD卡和主機(jī)

•eMMC芯片/卡

•UFS卡和主機(jī)

•NAND閃存芯片

•SSD驅(qū)動(dòng)器

•MIPI傳感器和顯示器

VTE-7100提供了一個(gè)用戶友好的MS Win10/11兼容應(yīng)用程序。

VTE-7100主屏幕允許用戶在一個(gè)窗口中可視化測(cè)試腳本執(zhí)行，在第二個(gè)窗口中顯示執(zhí)行功能的參數(shù)或測(cè)試的圖形結(jié)果，在第三個(gè)窗口中查看測(cè)試結(jié)果消息。

測(cè)試系統(tǒng)還可以被配置為使用多個(gè)信道執(zhí)行并行測(cè)試，包括同時(shí)測(cè)試Tx和Rx設(shè)備。

​ 深圳市銳測(cè)電子科技（Reetest）專注于提供針對(duì)各種芯片總線接口協(xié)議/Serdes/器件/系統(tǒng)級(jí)產(chǎn)品從物理層至協(xié)議層的測(cè)試解決方案，覆蓋R&D測(cè)試驗(yàn)證，RDT可靠性測(cè)試，芯片量產(chǎn)測(cè)試, AE/FAE等各個(gè)產(chǎn)品生命周期的測(cè)試。公司針對(duì)每一個(gè)產(chǎn)品線均有配備非常專業(yè)且富有經(jīng)驗(yàn)的技術(shù)支持工程師提供local的產(chǎn)品售前技術(shù)支持服務(wù)。